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Authors

K.T. Dovranov

Last known institution:
Karshi State University
5
h-index
0
i10-index
38
Citations
14
Works
Trends over time

Performance over time

Citation overview

Publications (bars) and citations (line) by year

  • Publications
  • Citations
03581001325385020232024202520262023: Publications 4, Citations 02024: Publications 7, Citations 262025: Publications 3, Citations 112026: Publications 0, Citations 1

Citation history

01325385020232024202520262023: Citations 02024: Citations 262025: Citations 112026: Citations 1

Publication history

03581020232024202520262023: Publications 42024: Publications 72025: Publications 32026: Publications 0

h-index evolution

Cumulative h-index by year

0134520232024202520262023: h-index 02024: h-index 42025: h-index 52026: h-index 5

Most-cited works

  1. Formation of thin Crsi <sub>2</sub> films by the solid-phase ion-plasma method and their thermoelectric properties20249 citations
  2. Formation of Mn4Si7/Si(111), CrSi2/Si(111), and CoSi2/Si(111) Thin Film and Evaluation of Their Optically Direct and Indirect Band Gap20246 citations
  3. Peculiarities of BaTiO<sub>3</sub> in electronic and X-Ray analysis20236 citations
  4. The solid-phase ion-plasma method and thermoelectric properties of thin CrSi2 films20246 citations
  5. Development of Technology for Obtaining Nanosized Heterostructured Films by Ion-Plasma Deposition20235 citations
  6. Preparation of Calcium Titanate Perovskite Compound, Optical and Structural Properties20242 citations
  7. Raman and IR Spectrum Analysis of CrSi2 Thin Films Formed in Direct Current and Variable Frequency Modes of a Magnetron Sputtering Device20242 citations
  8. Obtaining Thin Films from Semiconductor Compounds and Their X-Ray Analysis20242 citations
  9. ELECTROPHYSICAL PROPERTIES OF NANOFILMS20230 citations
  10. FTIR-АНАЛИЗ ТОНКИХ ПЛЕНОК КРЕМНИЯ И ОКСИДА КРЕМНИЯ20230 citations