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Journal

Semiconductor Science and Technology

ISSN:
0268-1242
2
h-index
15
Citations
4
Works

Trust signals

1 of 3 signals present

Independent positive signals — not a single “predatory/legitimate” verdict, but a converging picture.

  • DOAJ
    No data
    doaj.org
  • OAK list
    No data
    OAK
  • Valid ISSN
    Present
    ISSN

This is an information label, not an official ruling. A missing signal is not a penalty — a regional journal may simply not be in DOAJ.

Trends over time

Performance over time

Citation overview

Publications (bars) and citations (line) by year

  • Publications
  • Citations
0101220112013201420152019202120222023202420252011: Publications 0, Citations 12013: Publications 0, Citations 22014: Publications 0, Citations 12015: Publications 0, Citations 12019: Publications 0, Citations 12021: Publications 1, Citations 12022: Publications 0, Citations 12023: Publications 0, Citations 22024: Publications 0, Citations 22025: Publications 0, Citations 1

Citation history

01220112013201420152019202120222023202420252011: Citations 12013: Citations 22014: Citations 12015: Citations 12019: Citations 12021: Citations 12022: Citations 12023: Citations 22024: Citations 22025: Citations 1

Publication history

0120112013201420152019202120222023202420252011: Publications 02013: Publications 02014: Publications 02015: Publications 02019: Publications 02021: Publications 12022: Publications 02023: Publications 02024: Publications 02025: Publications 0

h-index evolution

Cumulative h-index by year

01220112013201420152019202120222023202420252011: h-index 12013: h-index 12014: h-index 12015: h-index 12019: h-index 12021: h-index 12022: h-index 12023: h-index 22024: h-index 22025: h-index 2

Most-cited works

  1. Photoelectric properties of higher manganese silicide (HMS)-SilangleMnrangle-M structures199911 citations
  2. Wave processes in silicon samples with nickel impurities arising at pulsed hydrostatic pressure20213 citations
  3. Superlinearity of photocurrent in polycrystalline Si p - n structures19961 citations
  4. Formation of radiation defects in silicon structures under low-intensity electron irradiation20010 citations
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