Russian Microelectronics
- ISSN:
- 1063-7397
3
h-index
24
Citations
12
Works
0.00
2-year mean citedness
Trust signals
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- OAK listNo dataOAK
- Valid ISSNPresentISSN
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Most-cited works
- Photoconductivity of silicon with nanoclusters of manganese atoms201010 citations
- IR photodetectors in the range of λ = 1.5–8 μm, based on silicon with multicharged nanoclusters of manganese atoms20126 citations
- Optical Properties of ZnO–LiNbO3 and ZnO–LiNbO3:Fe Structures20235 citations
- Silicon solar cells with Si-Ge microheterojunctions20121 citations
- Digital Shearograph for Detecting Defect in Materials20231 citations
- Minority-Carrier Generation at the Interface between Silicon and Lead Borosilicate Glass20011 citations
- Density of states at a gamma-irradiated Si/SiO2 interface: The effect of ultrasonic treatment20050 citations
- Experimental studies in quantum cryptography20110 citations
- Resistance of diamond optics to high-power fiber laser radiation20120 citations
- Influence of Nickel Impurity on the Operating Parameters of a Silicon Solar Cell20240 citations