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Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena

ISSN:
1012-0394
0
h-index
0
Citations
28
Works

Trust signals

1 of 3 signals present

Independent positive signals — not a single “predatory/legitimate” verdict, but a converging picture.

  • DOAJ
    No data
    doaj.org
  • OAK list
    No data
    OAK
  • Valid ISSN
    Present
    ISSN

This is an information label, not an official ruling. A missing signal is not a penalty — a regional journal may simply not be in DOAJ.

Trends over time

Performance over time

Citation overview

Publications (bars) and citations (line) by year

  • Publications
  • Citations
013450120032005200620072009201420152016202220232003: Publications 1, Citations 02005: Publications 4, Citations 02006: Publications 2, Citations 02007: Publications 1, Citations 02009: Publications 2, Citations 02014: Publications 1, Citations 02015: Publications 2, Citations 02016: Publications 1, Citations 02022: Publications 1, Citations 02023: Publications 1, Citations 0

Publication history

0134520032005200620072009201420152016202220232003: Publications 12005: Publications 42006: Publications 22007: Publications 12009: Publications 22014: Publications 12015: Publications 22016: Publications 12022: Publications 12023: Publications 1

h-index evolution

Cumulative h-index by year

0120032005200620072009201420152016202220232003: h-index 02005: h-index 02006: h-index 02007: h-index 02009: h-index 02014: h-index 02015: h-index 02016: h-index 02022: h-index 02023: h-index 0

Most-cited works

  1. Distribution of Defects in InAs<sub>1-x-y</sub>Sb<sub>x</sub>P<sub>y</sub>-InAs DHs19910 citations
  2. Nature of Defects in MOCVD Grown GaAlAs-GaAs QW DHs19910 citations
  3. X-Ray Diffractometry and Topography of CdHgTe Bulk Crystals and CdHgTe-CdTe Epitaxial Structures19910 citations
  4. New Applications of Diffraction Analysis for Dislocation Structure in High Lattice-Mismatch MBE Grown Epitaxial Structures19930 citations
  5. Oxygen Gettering on Buried Layers at Post-Implantation Annealing of Hydrogen Implanted Czochralski Silicon19970 citations
  6. Defect Formation during Erbium Implantation and Subsequent Annealing of Si:Er19970 citations
  7. Defect Engineering in Si: Ho Light-Emitting Structure Technology19990 citations
  8. Polarization Photosensitivity of Polycrystalline-Film Cu(In,Ga)Se<sub>2</sub>/CdS/ZnO Structures19990 citations
  9. Relation Between Photoconductivity and Deposition Conditions of Evaporated CuInSe<sub>2</sub> Polycrystalline Thin Films19990 citations
  10. Photoelectrical Properties of In/p-(Cu,Ag)(In,Ga) (Se,Te)<sub>2</sub> Surface-Barrier Structures19990 citations