Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena
- ISSN:
- 1012-0394
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Trust signals
1 of 3 signals presentIndependent positive signals — not a single “predatory/legitimate” verdict, but a converging picture.
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Most-cited works
- Distribution of Defects in InAs<sub>1-x-y</sub>Sb<sub>x</sub>P<sub>y</sub>-InAs DHs19910 citations
- Nature of Defects in MOCVD Grown GaAlAs-GaAs QW DHs19910 citations
- X-Ray Diffractometry and Topography of CdHgTe Bulk Crystals and CdHgTe-CdTe Epitaxial Structures19910 citations
- New Applications of Diffraction Analysis for Dislocation Structure in High Lattice-Mismatch MBE Grown Epitaxial Structures19930 citations
- Oxygen Gettering on Buried Layers at Post-Implantation Annealing of Hydrogen Implanted Czochralski Silicon19970 citations
- Defect Formation during Erbium Implantation and Subsequent Annealing of Si:Er19970 citations
- Defect Engineering in Si: Ho Light-Emitting Structure Technology19990 citations
- Polarization Photosensitivity of Polycrystalline-Film Cu(In,Ga)Se<sub>2</sub>/CdS/ZnO Structures19990 citations
- Relation Between Photoconductivity and Deposition Conditions of Evaporated CuInSe<sub>2</sub> Polycrystalline Thin Films19990 citations
- Photoelectrical Properties of In/p-(Cu,Ag)(In,Ga) (Se,Te)<sub>2</sub> Surface-Barrier Structures19990 citations