Физика и техника полупроводников
- ISSN:
- 0015-3222
2
h-index
11
Citations
16
Works
Trust signals
1 of 3 signals presentIndependent positive signals — not a single “predatory/legitimate” verdict, but a converging picture.
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- OAK listNo dataOAK
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Citation overview
Publications (bars) and citations (line) by year
- Publications
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Publication history
h-index evolution
Cumulative h-index by year
Most-cited works
- Effect of nickel on the lifetime of charge carriers in silicon solar cells20225 citations
- Effect of the presence of a sufficiently high phosphorus concentration on the concentration distribution of gallium in silicon20222 citations
- Features of the electrophysical parameters of silicon serially doped with impurity atoms of phosphorus and boron20221 citations
- Polarization-spectral dependences of three-photon interband absorption of light and linear-circular dichroism in semiconductors with cubic symmetry20221 citations
- Сравнительное исследование фотоэлементов на основе кремния, легированного никелем различными методами20221 citations
- Comparative study of photocells based on silicon doped with nickel by various methods20221 citations
- Эффект инжекционного обеднения в p-Si-n-(Si-=SUB=-2-=/SUB=-)-=SUB=-1-x-=/SUB=-(ZnSe)-=SUB=-x-=/SUB=- (0≤ x≤0.01) гетероструктуре20180 citations
- Анизотропия отрицательного магнетосопротивления в эапитаксиальных слоях GaMnAs20200 citations
- Размерное квантование в n-GaP20200 citations
- Влияние одноосной упругой деформации на вольт-амперную характеристику поверхностно-барьерных диодов Sb-p-Si<Mn>-Au20200 citations