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Journal

Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques

ISSN:
1027-4510
12
h-index
389
Citations
110
Works
0.00
2-year mean citedness

Trust signals

1 of 3 signals present

Independent positive signals — not a single “predatory/legitimate” verdict, but a converging picture.

  • DOAJ
    No data
    doaj.org
  • OAK list
    No data
    OAK
  • Valid ISSN
    Present
    ISSN

This is an information label, not an official ruling. A missing signal is not a penalty — a regional journal may simply not be in DOAJ.

Most-cited works

  1. Effect of Ar+-ion bombardment on the composition and structure of the surface of CoSi2/Si(111) nanofilms201523 citations
  2. On the creation of ordered nuclei by ion bombardment for obtaining nanoscale si structures on the surface of CaF2 films201721 citations
  3. On the synthesis of nanoscale phases of metal silicides in the near-surface region of silicon and the study of their electronic structures by passing light201721 citations
  4. Formation and Electronic Structure of Barium-Monosilicide- and Barium-Disilicide Films202117 citations
  5. Energy spectra of SiO2 nanofilms formed on a silicon surface by ion implantation201516 citations
  6. Procedure for determining defects in sputtered clusters of ionic crystals201614 citations
  7. Energy Threshold of the Atomic and Cluster Sputtering of Some Elements under Bombardment with Cs, Rb, and Na Ions201914 citations
  8. Structure and electronic properties of nanoscale phases and nanofilms of metal silicides produced by ion implantation in combination with annealing201414 citations
  9. Applying low-energy ion implantation in the creation of nanocontacts on the surface of ultrathin semiconductor films201314 citations
  10. Effect of thermal and laser annealing on the atom distribution profiles in Si(111) implanted with P+ and B+ ions201712 citations
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