Diffusion Foundations and Materials Applications
- ISSN:
- 2674-029X
0
h-index
0
Citations
4
Works
0.00
2-year mean citedness
Trust signals
1 of 3 signals presentIndependent positive signals — not a single “predatory/legitimate” verdict, but a converging picture.
- DOAJNo datadoaj.org
- OAK listNo dataOAK
- Valid ISSNPresentISSN
This is an information label, not an official ruling. A missing signal is not a penalty — a regional journal may simply not be in DOAJ.
Trends over time
Performance over time
Citation overview
Publications (bars) and citations (line) by year
- Publications
- Citations
Publication history
h-index evolution
Cumulative h-index by year
Most-cited works
- Enhanced Surface Defect Detection in Industrial Manufacturing Using Convolutional Neural Networks and Advanced Imaging Techniques20250 citations
- Automated Surface Defect Detection in Machined Parts Using Deep Learning Techniques and Machine Vision20250 citations
- Study of Trajectories Scattered Ar+ Ions from the CdTe(001) <110> at the Glancing Incidence20250 citations
- Defect Detection, Aluminium-Based and Green Materials20250 citations