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Journal

Thin Solid Films

ISSN:
0040-6090
4
h-index
40
Citations
19
Works
0.00
2-year mean citedness

Trust signals

1 of 3 signals present

Independent positive signals — not a single “predatory/legitimate” verdict, but a converging picture.

  • DOAJ
    No data
    doaj.org
  • OAK list
    No data
    OAK
  • Valid ISSN
    Present
    ISSN

This is an information label, not an official ruling. A missing signal is not a penalty — a regional journal may simply not be in DOAJ.

Most-cited works

  1. Comparison of electron irradiation on the formation of surface defects in situ and post thin-film LiF/Si(111) deposition202113 citations
  2. Target current spectroscopy of the alkali halides KCl, CsCl and KBr19946 citations
  3. Oxide film assisted dopant diffusion in silicon carbide20105 citations
  4. Study of polycrystalline CdTe films by contact and contactless pulsed photo-ionization spectroscopy20184 citations
  5. Characteristics of thin Sb2Se3 films obtained by the chemical molecular beam deposition method for thin-film solar cells20234 citations
  6. Physical properties of thin film Cu2S/ZnxCd1−xS heterojunction solar cells fabricated by aqueous treatment and solid state reaction19843 citations
  7. Physical properties of II–VI binary and multi-component compound films and heterostructures fabricated by chemical vapour deposition19882 citations
  8. Nanomechanical characterization of bioglass films synthesized by magnetron sputtering20132 citations
  9. Fabrication and crystallophysical properties of (ZnSe)x(CdTe)1−x (x = 0−1) multicomponent system films19881 citations
  10. Some peculiarities of the crystallization of semiconductor thin films19760 citations