Kh.S. Daliev
- Сўнгги маълум муассаса:
- National University of Uzbekistan
- ORCID:
- 0000-0002-2164-6797
5
h-индекс
1
i10-индекси
66
Иқтибослар
28
Асарлар
Вақт бўйича
Вақт бўйича таҳлил
Иқтибос шарҳи
Йиллар бўйича нашрлар (устун) ва иқтибослар (чизиқ)
- Нашрлар
- Иқтибослар
Иқтибос тарихи
Нашр тарихи
h-индекс эволюцияси
Йиллар бўйича жамланган h-индекс
Энг кўп иқтибос қилинган асарлар
- Features of the behavior of lanthanum and hafnium atoms in silicon20069 иқтибос
- Raman spectroscopy of silicon, doped with platinum and irradiated by protons20239 иқтибос
- Influence of the parameters to transition capacitance at NCDS-PSI heterostructure20239 иқтибос
- Thermally Induced Deep Centers in Silicon Doped with Europium or Lanthanum20018 иқтибос
- The Influence of the Impurities with Deep Levels on the Iron Behavior in Silicon19974 иқтибос
- Defect Formation in MIS Structures Based on Silicon with an Impurity of Ytterbium20243 иқтибос
- Defect Structure of Silicon Doped with Erbium20243 иқтибос
- Changes in the Structure and Properties of Silicon During Ytterbium Doping: The Results of o Comprehensive Analysis20242 иқтибос
- Properties of Single Crystal Silicon Doped with Vanadium20241 иқтибос
- Influence of the Temperature and Cyclic Deformations of (BixSb1–x)2Te3 Films on Their Resistance20211 иқтибос