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Журнал

Technical Physics

ISSN:
1063-7842
10
h-индекс
350
Иқтибослар
133
Асарлар
0.00
2-йиллик ўртача иқтибос

Ишонч сигналлари

1 дан 3 сигнал мавжуд

Мустақил ижобий сигналлар — ягона “предатор/қонуний” ҳукми эмас, балки яқинлашувчи тасвир.

  • DOAJ
    Маълумот йўқ
    doaj.org
  • ОАК рўйхати
    Маълумот йўқ
    ОАК
  • Яроқли ISSN
    Мавжуд
    ISSN

Бу ахборот ёрлиғи, расмий қарор эмас. Сигнал йўқлиги жазо эмас — масалан, минтақавий журнал DOAJ'да бўлмаслиги мумкин.

Энг кўп иқтибос қилинган асарлар

  1. Optimum ion implantation and annealing conditions for stimulating secondary negative ion emission201119 иқтибос
  2. Electron spectroscopy of the nanostructures created in Si, GaAs, and CaF2 surface layers using low-energy ion implantation201319 иқтибос
  3. Formation of nanosize silicides films on the Si(111) and Si(100) surfaces by low-energy ion implantation201415 иқтибос
  4. Analysis of the structure and properties of heterostructured nanofilms prepared by epitaxy and ion implantation methods201315 иқтибос
  5. Composition and properties of nanoscale Si structures formed on the CoSi2/Si(111) surface by Ar+ ion bombardment201714 иқтибос
  6. Structure and Properties of a Bilayer Nanodimensional CoSi2/Si/CoSi2/Si System Obtained by Ion Implantation201814 иқтибос
  7. Effect of the O+2-ion bombardment on the TiN composition and structure201513 иқтибос
  8. Electronic structure of Ga1–x Al x As nanostructures grown on the GaAs surface by ion implantation201513 иқтибос
  9. Escape Depth of Secondary and Photoelectrons from CdTe Films with a Ba Film201912 иқтибос
  10. Silicon with Magnetic Nanoclusters of Manganese Atoms as a New Ferromagnetic Material201910 иқтибос