Andrey Orekhov
- Soʻnggi maʼlum muassasa:
- A.V. Shubnikov Institute of Crystallography
- ORCID:
- 0000-0002-7517-5484
4
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i10-indeksi
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- The Influence of Structural Defects in Silicon on the Formation of Photosensitive Mn4Si7–Si❬Mn❭–Mn4Si7 and Mn4Si7–Si❬Mn❭–M Heterostructures201921 iqtibos
- Electron microscopy characterization of higher manganese silicide film structure on silicon20167 iqtibos
- Structure of thermoelectric films of higher manganese silicide on silicon according to electron microscopy data20175 iqtibos
- Mn4Si7-Si〈Mn〉-Mn4Si7 and Mn4Si7-Si〈Mn〉-M photodiodes20114 iqtibos
- Influence of structural defects in silicon on formation of photosensitive heterostructures Mn4Si7-Si-Mn4Si7 and Mn4Si7-Si-M20183 iqtibos
- About the mechanism of formation and growth of the higher manganese silicide films on silicon20053 iqtibos
- On the growth of higher manganese silicide films on silicon20102 iqtibos
- Investigation of the Magnesium Silicide -- Mg<sub>2</sub>Si Films20060 iqtibos
- About the Interface Between the Higher Manganese Silicide Film and Si (111)20060 iqtibos
- Overgrowth of the Mn4Si7 phase on/around the hexagonal SiC and cubic MnSi impurity phases in the Mn4Si7/Si films20080 iqtibos