Asosiy kontentga oʻtish
AkademScholar

Kashfiyot

Xizmatlar

Identifikatsiya

Ishlab chiquvchilar uchun

Ekotizim

Muassasalar

Institute of Microelectronics

Nom variantlari: IMEACAS

Davlat:
CN
ROR:
https://ror.org/02s6gs133
4
h-indeks
93
Iqtiboslar
47
Asarlar
107
Mualliflar
Vaqt boʻyicha

Vaqt boʻyicha tahlil

Iqtibos sharhi

Yillar boʻyicha nashrlar (ustun) va iqtiboslar (chiziq)

  • Nashrlar
  • Iqtiboslar
03581001325385020172018201920202021202220232024202520262017: Nashrlar 2, Iqtiboslar 12018: Nashrlar 3, Iqtiboslar 02019: Nashrlar 4, Iqtiboslar 02020: Nashrlar 4, Iqtiboslar 22021: Nashrlar 4, Iqtiboslar 42022: Nashrlar 4, Iqtiboslar 42023: Nashrlar 2, Iqtiboslar 122024: Nashrlar 9, Iqtiboslar 332025: Nashrlar 2, Iqtiboslar 252026: Nashrlar 1, Iqtiboslar 11

Iqtibos tarixi

01325385020172018201920202021202220232024202520262017: Iqtiboslar 12018: Iqtiboslar 02019: Iqtiboslar 02020: Iqtiboslar 22021: Iqtiboslar 42022: Iqtiboslar 42023: Iqtiboslar 122024: Iqtiboslar 332025: Iqtiboslar 252026: Iqtiboslar 11

Nashr tarixi

03581020172018201920202021202220232024202520262017: Nashrlar 22018: Nashrlar 32019: Nashrlar 42020: Nashrlar 42021: Nashrlar 42022: Nashrlar 42023: Nashrlar 22024: Nashrlar 92025: Nashrlar 22026: Nashrlar 1

h-indeks evolyutsiyasi

Yillar boʻyicha jamlangan h-indeks

0134520172018201920202021202220232024202520262017: h-indeks 12018: h-indeks 12019: h-indeks 12020: h-indeks 12021: h-indeks 22022: h-indeks 22023: h-indeks 22024: h-indeks 32025: h-indeks 42026: h-indeks 4

Eng koʻp iqtibos qilingan asarlar

  1. Influence of the irradiation of ions of different mass on the formation of surface defects of lithium fluoride thin films20226 iqtibos
  2. RETRACTED: Technology of stabilizing parameters of twocolor light-emitting diodes20245 iqtibos
  3. Outstanding nonlinear optical properties of all-inorganic perovskite CsPbX3 (X=Cl, Br, I) precursor solutions and polycrystalline films20231 iqtibos
  4. Effect of substrate temperature on the microstructural and optical properties of chemical molecular beam deposited sb2s3 films20241 iqtibos
  5. Influence of Fabrication Conditions on Properties of Si:Er Light-Emitting Structures19970 iqtibos
  6. Defect Formation during Erbium Implantation and Subsequent Annealing of Si:Er19970 iqtibos
  7. Structural modification of fullerene thin films by highly charged iron ions20070 iqtibos
  8. Environment-induced overheating phenomena in Au-nanowire based Josephson junctions20210 iqtibos
  9. Author Correction: Environment-induced overheating phenomena in Au-nanowire based Josephson junctions20210 iqtibos
  10. DEEP LEVEL TRANSIENT SPECTROSCOPY OF DEFECTS IN SILICON MULTILAYER STRUCTURES DOPED WITH HAFNIUM ATOMS20220 iqtibos